uboot/test/dm
Przemyslaw Marczak c48cb7ebfb sandbox: add ADC unit tests
This commit adds unit tests for ADC uclass's methods using sandbox ADC.

Testing proper ADC binding:
- dm_test_adc_bind()                    - device binding
- dm_test_adc_wrong_channel_selection() - checking wrong channel selection

Testing ADC supply operations:
- dm_test_adc_supply():
  - Vdd/Vss values validating
  - Vdd regulator updated value validating
  - Vdd regulator's auto enable state validating

Testing ADC operations results:
- dm_test_adc_single_channel_conversion() - single channel start/data
- dm_test_adc_single_channel_shot()       - single channel shot
- dm_test_adc_multi_channel_conversion()  - multi channel start/data
- dm_test_adc_multi_channel_shot()        - multi channel single shot

Signed-off-by: Przemyslaw Marczak <p.marczak@samsung.com>
Cc: Simon Glass <sjg@chromium.org>
Signed-off-by: Minkyu Kang <mk7.kang@samsung.com>
2015-11-02 10:38:00 +09:00
..
Kconfig
Makefile sandbox: add ADC unit tests 2015-11-02 10:38:00 +09:00
adc.c sandbox: add ADC unit tests 2015-11-02 10:38:00 +09:00
bus.c dm: Rename dev_get_parentdata() to dev_get_parent_priv() 2015-10-23 09:42:28 -06:00
clk.c
cmd_dm.c
core.c
eth.c dm: test: Add a new test case against dm eth codes for NULL pointer access 2015-10-29 14:05:52 -05:00
gpio.c
i2c.c
led.c
mmc.c
pci.c
pmic.c
ram.c
regmap.c
regulator.c
remoteproc.c
reset.c
rtc.c
sf.c
spi.c
syscon.c
test-dm.sh
test-driver.c
test-fdt.c
test-main.c
test-uclass.c
usb.c