..
Kconfig
…
Makefile
Add a power domain framework/uclass
2016-07-27 16:29:56 -06:00
adc.c
…
blk.c
dm: sandbox: mmc: Enable building MMC code for sandbox
2016-05-17 09:54:43 -06:00
bus.c
dm: Convert users from dm_scan_fdt_node() to dm_scan_fdt_dev()
2016-07-27 14:15:07 -06:00
clk.c
clk: convert API to match reset/mailbox style
2016-06-19 17:05:55 -06:00
cmd_dm.c
…
core.c
test/dm/core.c: Make pre-reloc test use pre-reloc struct
2016-04-14 11:51:39 -06:00
eth.c
…
gpio.c
dm: test: Add GPIO open drain tests
2016-06-03 22:14:20 -07:00
i2c.c
dm: Use dm_scan_fdt_dev() directly where possible
2016-07-27 14:15:54 -06:00
led.c
…
mailbox.c
mailbox: implement a sandbox test
2016-05-26 20:48:31 -06:00
mmc.c
dm: mmc: test: Add tests for MMC
2016-05-17 09:54:43 -06:00
pci.c
dm: test: Convert PCI tests to use the DM PCI API
2016-01-12 10:19:09 -07:00
pmic.c
…
power-domain.c
Add a power domain framework/uclass
2016-07-27 16:29:56 -06:00
ram.c
…
regmap.c
…
regulator.c
…
remoteproc.c
…
reset.c
reset: implement a reset test
2016-06-19 17:05:55 -06:00
rtc.c
…
sf.c
…
spi.c
dm: Use dm_scan_fdt_dev() directly where possible
2016-07-27 14:15:54 -06:00
spmi.c
spmi: Add sandbox test driver
2016-04-01 17:18:12 -04:00
syscon.c
dm: syscon: Allow finding devices by driver data
2016-01-24 12:07:19 +08:00
sysreset.c
Rename reset to sysreset
2016-05-26 20:48:31 -06:00
test-driver.c
…
test-fdt.c
…
test-main.c
test/dm: clear unit test failure count each run
2016-01-28 21:01:24 -07:00
test-uclass.c
…
timer.c
…
usb.c
dm: usb: Clean up USB after each test
2016-03-14 15:34:50 -06:00
video.c
video: test: Adjust order of file closure
2016-02-06 13:57:15 +01:00