doc: driver-model: Update dm tests run using test.py
Since all the tests are implemented in pytest infrastructure, So update the dm tests with the same instead of ./test/dm/test-dm.sh Cc: Tom Rini <trini@konsulko.com> Cc: Simon Glass <sjg@chromium.org> Acked-by: Stephen Warren <swarren@nvidia.com> Signed-off-by: Jagan Teki <jteki@openedev.com>
This commit is contained in:
Jagan Teki
Simon Glass
parent
770eb30ed9
commit
e57f9c8eef
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@ -90,110 +90,137 @@ The intent with driver model is that the core portion has 100% test coverage
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in sandbox, and every uclass has its own test. As a move towards this, tests
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in sandbox, and every uclass has its own test. As a move towards this, tests
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are provided in test/dm. To run them, try:
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are provided in test/dm. To run them, try:
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./test/dm/test-dm.sh
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./test/py/test.py --bd sandbox --build -k ut_dm -v
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You should see something like this:
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You should see something like this:
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<...U-Boot banner...>
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(venv)$ ./test/py/test.py --bd sandbox --build -k ut_dm -v
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Running 53 driver model tests
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+make O=/root/u-boot/build-sandbox -s sandbox_defconfig
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Test: dm_test_autobind
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+make O=/root/u-boot/build-sandbox -s -j8
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Test: dm_test_autoprobe
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============================= test session starts ==============================
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Test: dm_test_bus_child_post_bind
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platform linux2 -- Python 2.7.5, pytest-2.9.0, py-1.4.31, pluggy-0.3.1 -- /root/u-boot/venv/bin/python
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Test: dm_test_bus_child_post_bind_uclass
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cachedir: .cache
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Test: dm_test_bus_child_pre_probe_uclass
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rootdir: /root/u-boot, inifile:
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Test: dm_test_bus_children
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collected 199 items
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Device 'c-test@0': seq 0 is in use by 'd-test'
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Device 'c-test@1': seq 1 is in use by 'f-test'
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Test: dm_test_bus_children_funcs
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Test: dm_test_bus_children_iterators
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Test: dm_test_bus_parent_data
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Test: dm_test_bus_parent_data_uclass
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Test: dm_test_bus_parent_ops
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Test: dm_test_bus_parent_platdata
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Test: dm_test_bus_parent_platdata_uclass
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Test: dm_test_children
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Test: dm_test_device_get_uclass_id
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Test: dm_test_eth
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Using eth@10002000 device
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Using eth@10003000 device
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Using eth@10004000 device
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Test: dm_test_eth_alias
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Using eth@10002000 device
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Using eth@10004000 device
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Using eth@10002000 device
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Using eth@10003000 device
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Test: dm_test_eth_prime
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Using eth@10003000 device
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Using eth@10002000 device
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Test: dm_test_eth_rotate
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Error: eth@10004000 address not set.
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test/py/tests/test_ut.py::test_ut_dm_init PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_adc_bind] PASSED
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Error: eth@10004000 address not set.
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test/py/tests/test_ut.py::test_ut[ut_dm_adc_multi_channel_conversion] PASSED
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Using eth@10002000 device
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test/py/tests/test_ut.py::test_ut[ut_dm_adc_multi_channel_shot] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_adc_single_channel_conversion] PASSED
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Error: eth@10004000 address not set.
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test/py/tests/test_ut.py::test_ut[ut_dm_adc_single_channel_shot] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_adc_supply] PASSED
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Error: eth@10004000 address not set.
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test/py/tests/test_ut.py::test_ut[ut_dm_adc_wrong_channel_selection] PASSED
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Using eth@10004000 device
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test/py/tests/test_ut.py::test_ut[ut_dm_autobind] PASSED
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Test: dm_test_fdt
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test/py/tests/test_ut.py::test_ut[ut_dm_autobind_uclass_pdata_alloc] PASSED
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Test: dm_test_fdt_offset
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test/py/tests/test_ut.py::test_ut[ut_dm_autobind_uclass_pdata_valid] PASSED
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Test: dm_test_fdt_pre_reloc
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test/py/tests/test_ut.py::test_ut[ut_dm_autoprobe] PASSED
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Test: dm_test_fdt_uclass_seq
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test/py/tests/test_ut.py::test_ut[ut_dm_bus_child_post_bind] PASSED
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Test: dm_test_gpio
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test/py/tests/test_ut.py::test_ut[ut_dm_bus_child_post_bind_uclass] PASSED
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extra-gpios: get_value: error: gpio b5 not reserved
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test/py/tests/test_ut.py::test_ut[ut_dm_bus_child_pre_probe_uclass] PASSED
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Test: dm_test_gpio_anon
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test/py/tests/test_ut.py::test_ut[ut_dm_bus_children] PASSED
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Test: dm_test_gpio_copy
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test/py/tests/test_ut.py::test_ut[ut_dm_bus_children_funcs] PASSED
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Test: dm_test_gpio_leak
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test/py/tests/test_ut.py::test_ut[ut_dm_bus_children_iterators] PASSED
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extra-gpios: get_value: error: gpio b5 not reserved
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test/py/tests/test_ut.py::test_ut[ut_dm_bus_parent_data] PASSED
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Test: dm_test_gpio_phandles
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test/py/tests/test_ut.py::test_ut[ut_dm_bus_parent_data_uclass] PASSED
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Test: dm_test_gpio_requestf
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test/py/tests/test_ut.py::test_ut[ut_dm_bus_parent_ops] PASSED
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Test: dm_test_i2c_bytewise
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test/py/tests/test_ut.py::test_ut[ut_dm_bus_parent_platdata] PASSED
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Test: dm_test_i2c_find
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test/py/tests/test_ut.py::test_ut[ut_dm_bus_parent_platdata_uclass] PASSED
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Test: dm_test_i2c_offset
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test/py/tests/test_ut.py::test_ut[ut_dm_children] PASSED
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Test: dm_test_i2c_offset_len
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test/py/tests/test_ut.py::test_ut[ut_dm_clk_base] PASSED
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Test: dm_test_i2c_probe_empty
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test/py/tests/test_ut.py::test_ut[ut_dm_clk_periph] PASSED
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Test: dm_test_i2c_read_write
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test/py/tests/test_ut.py::test_ut[ut_dm_device_get_uclass_id] PASSED
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Test: dm_test_i2c_speed
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test/py/tests/test_ut.py::test_ut[ut_dm_eth] PASSED
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Test: dm_test_leak
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test/py/tests/test_ut.py::test_ut[ut_dm_eth_act] PASSED
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Test: dm_test_lifecycle
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test/py/tests/test_ut.py::test_ut[ut_dm_eth_alias] PASSED
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Test: dm_test_net_retry
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test/py/tests/test_ut.py::test_ut[ut_dm_eth_prime] PASSED
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Using eth@10004000 device
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test/py/tests/test_ut.py::test_ut[ut_dm_eth_rotate] PASSED
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Using eth@10002000 device
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test/py/tests/test_ut.py::test_ut[ut_dm_fdt] PASSED
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Using eth@10004000 device
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test/py/tests/test_ut.py::test_ut[ut_dm_fdt_offset] PASSED
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Test: dm_test_operations
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test/py/tests/test_ut.py::test_ut[ut_dm_fdt_pre_reloc] PASSED
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Test: dm_test_ordering
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test/py/tests/test_ut.py::test_ut[ut_dm_fdt_uclass_seq] PASSED
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Test: dm_test_pci_base
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test/py/tests/test_ut.py::test_ut[ut_dm_gpio] PASSED
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Test: dm_test_pci_swapcase
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test/py/tests/test_ut.py::test_ut[ut_dm_gpio_anon] PASSED
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Test: dm_test_platdata
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test/py/tests/test_ut.py::test_ut[ut_dm_gpio_copy] PASSED
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Test: dm_test_pre_reloc
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test/py/tests/test_ut.py::test_ut[ut_dm_gpio_leak] PASSED
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Test: dm_test_remove
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test/py/tests/test_ut.py::test_ut[ut_dm_gpio_phandles] PASSED
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Test: dm_test_spi_find
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test/py/tests/test_ut.py::test_ut[ut_dm_gpio_requestf] PASSED
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Invalid chip select 0:0 (err=-19)
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test/py/tests/test_ut.py::test_ut[ut_dm_i2c_bytewise] PASSED
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SF: Failed to get idcodes
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test/py/tests/test_ut.py::test_ut[ut_dm_i2c_find] PASSED
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SF: Detected M25P16 with page size 256 Bytes, erase size 64 KiB, total 2 MiB
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test/py/tests/test_ut.py::test_ut[ut_dm_i2c_offset] PASSED
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Test: dm_test_spi_flash
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test/py/tests/test_ut.py::test_ut[ut_dm_i2c_offset_len] PASSED
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2097152 bytes written in 0 ms
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test/py/tests/test_ut.py::test_ut[ut_dm_i2c_probe_empty] PASSED
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SF: Detected M25P16 with page size 256 Bytes, erase size 64 KiB, total 2 MiB
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test/py/tests/test_ut.py::test_ut[ut_dm_i2c_read_write] PASSED
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SPI flash test:
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test/py/tests/test_ut.py::test_ut[ut_dm_i2c_speed] PASSED
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0 erase: 0 ticks, 65536000 KiB/s 524288.000 Mbps
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test/py/tests/test_ut.py::test_ut[ut_dm_leak] PASSED
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1 check: 0 ticks, 65536000 KiB/s 524288.000 Mbps
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test/py/tests/test_ut.py::test_ut[ut_dm_led_base] PASSED
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2 write: 0 ticks, 65536000 KiB/s 524288.000 Mbps
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test/py/tests/test_ut.py::test_ut[ut_dm_led_gpio] PASSED
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3 read: 0 ticks, 65536000 KiB/s 524288.000 Mbps
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test/py/tests/test_ut.py::test_ut[ut_dm_led_label] PASSED
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Test passed
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test/py/tests/test_ut.py::test_ut[ut_dm_lifecycle] PASSED
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0 erase: 0 ticks, 65536000 KiB/s 524288.000 Mbps
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test/py/tests/test_ut.py::test_ut[ut_dm_mmc_base] PASSED
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1 check: 0 ticks, 65536000 KiB/s 524288.000 Mbps
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test/py/tests/test_ut.py::test_ut[ut_dm_net_retry] PASSED
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2 write: 0 ticks, 65536000 KiB/s 524288.000 Mbps
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test/py/tests/test_ut.py::test_ut[ut_dm_operations] PASSED
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3 read: 0 ticks, 65536000 KiB/s 524288.000 Mbps
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test/py/tests/test_ut.py::test_ut[ut_dm_ordering] PASSED
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Test: dm_test_spi_xfer
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test/py/tests/test_ut.py::test_ut[ut_dm_pci_base] PASSED
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SF: Detected M25P16 with page size 256 Bytes, erase size 64 KiB, total 2 MiB
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test/py/tests/test_ut.py::test_ut[ut_dm_pci_busnum] PASSED
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Test: dm_test_uclass
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test/py/tests/test_ut.py::test_ut[ut_dm_pci_swapcase] PASSED
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Test: dm_test_uclass_before_ready
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test/py/tests/test_ut.py::test_ut[ut_dm_platdata] PASSED
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Test: dm_test_usb_base
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test/py/tests/test_ut.py::test_ut[ut_dm_power_pmic_get] PASSED
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Test: dm_test_usb_flash
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test/py/tests/test_ut.py::test_ut[ut_dm_power_pmic_io] PASSED
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USB-1: scanning bus 1 for devices... 2 USB Device(s) found
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test/py/tests/test_ut.py::test_ut[ut_dm_power_regulator_autoset] PASSED
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Failures: 0
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test/py/tests/test_ut.py::test_ut[ut_dm_power_regulator_autoset_list] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_power_regulator_get] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_power_regulator_set_get_current] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_power_regulator_set_get_enable] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_power_regulator_set_get_mode] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_power_regulator_set_get_voltage] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_pre_reloc] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_ram_base] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_regmap_base] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_regmap_syscon] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_remoteproc_base] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_remove] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_reset_base] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_reset_walk] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_rtc_base] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_rtc_dual] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_rtc_reset] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_rtc_set_get] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_spi_find] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_spi_flash] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_spi_xfer] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_syscon_base] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_syscon_by_driver_data] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_timer_base] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_uclass] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_uclass_before_ready] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_uclass_devices_find] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_uclass_devices_find_by_name] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_uclass_devices_get] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_uclass_devices_get_by_name] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_usb_base] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_usb_flash] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_usb_keyb] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_usb_multi] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_usb_remove] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_usb_tree] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_usb_tree_remove] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_usb_tree_reorder] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_video_base] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_video_bmp] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_video_bmp_comp] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_video_chars] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_video_context] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_video_rotation1] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_video_rotation2] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_video_rotation3] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_video_text] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_video_truetype] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_video_truetype_bs] PASSED
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test/py/tests/test_ut.py::test_ut[ut_dm_video_truetype_scroll] PASSED
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======================= 84 tests deselected by '-kut_dm' =======================
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================== 115 passed, 84 deselected in 3.77 seconds ===================
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What is going on?
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What is going on?
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-----------------
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-----------------
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Loading…
Reference in New Issue