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dm: usb: Avoid time delays in sandbox tests 

Currently the USB tests take around two seconds to run. Remove these
unnecessary time delays so that the tests run quickly.

Signed-off-by: Simon Glass <sjg@chromium.org>
This commit is contained in:
Simon Glass 2015-11-08 23:47:44 -07:00
parent 9723563aa8
commit 3884c98c32
3 changed files with 14 additions and 1 deletions
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10
common/usb_hub.c
View File

@ -31,6 +31,9 @@
#include <asm/unaligned.h>
#include <linux/ctype.h>
#include <asm/byteorder.h>
#ifdef CONFIG_SANDBOX
#include <asm/state.h>
#endif
#include <asm/unaligned.h>
#include <dm/root.h>
@ -466,7 +469,12 @@ static int usb_hub_configure(struct usb_device *dev)
unsigned short portstatus, portchange;
int ret;
ulong start = get_timer(0);
uint delay = CONFIG_SYS_HZ;
#ifdef CONFIG_SANDBOX
if (state_get_skip_delays())
delay = 0;
#endif
#ifdef CONFIG_DM_USB
debug("\n\nScanning '%s' port %d\n", dev->dev->name, i + 1);
#else
@ -498,7 +506,7 @@ static int usb_hub_configure(struct usb_device *dev)
if (portstatus & USB_PORT_STAT_CONNECTION)
break;
} while (get_timer(start) < CONFIG_SYS_HZ * 1);
} while (get_timer(start) < delay);
if (ret < 0)
continue;

2
test/dm/test-main.c
View File

@ -9,6 +9,7 @@
#include <dm.h>
#include <errno.h>
#include <malloc.h>
#include <asm/state.h>
#include <dm/test.h>
#include <dm/root.h>
#include <dm/uclass-internal.h>
@ -113,6 +114,7 @@ static int dm_test_main(const char *test_name)
ut_assertok(dm_scan_fdt(gd->fdt_blob, false));
test->func(uts);
state_set_skip_delays(false);
ut_assertok(dm_test_destroy(uts));
}

3
test/dm/usb.c
View File

@ -8,6 +8,8 @@
#include <dm.h>
#include <usb.h>
#include <asm/io.h>
#include <asm/state.h>
#include <dm/device-internal.h>
#include <dm/test.h>
#include <test/ut.h>
@ -35,6 +37,7 @@ static int dm_test_usb_flash(struct unit_test_state *uts)
block_dev_desc_t *dev_desc;
char cmp[1024];
state_set_skip_delays(true);
ut_assertok(usb_init());
ut_assertok(uclass_get_device(UCLASS_MASS_STORAGE, 0, &dev));
ut_assertok(get_device("usb", "0", &dev_desc));